Rath Ung
5Patents
2h-index
5Co-inventors
30Inventor score
Filing activity: May 27, 2005 → Jan 17, 2006
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7457177B2 | Random access memory including circuit to compress comparison results | Physics | 3 | Active |
| US7299388B2 | Method and apparatus for selectively accessing and configuring individual chips of a semi-conductor wafer | Physics | 3 | Expired |
| US7313033B2 | Random access memory including first and second voltage sources | Physics | 2 | Expired |
| US7539911B2 | Test mode for programming rate and precharge time for DRAM activate-precharge cycle | Physics | 1 | Expired |
| US7362632B2 | Test parallelism increase by tester controllable switching of chip select groups | Physics | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.