Robert Cappel
3Patents
2h-index
13Co-inventors
34Inventor score
Filing activity: Apr 5, 2017 → Jan 18, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10761128B2 | Methods and systems for inline parts average testing and latent reliability defect detection | Emerging Cross-Sectional Technologies | 9 | Active |
| US11293970B2 | Advanced in-line part average testing | Physics | 3 | Active |
| US11754625B2 | System and method for identifying latent reliability defects in semiconductor devices | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.