Shuo-Fen Kuo
4Patents
2h-index
6Co-inventors
30Inventor score
Filing activity: Mar 12, 2010 → Sep 16, 2013
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8984354B2 | Test system which shares a register in different modes | Physics | 4 | Active |
| US8572444B2 | Memory apparatus and testing method thereof | Physics | 4 | Active |
| US9568553B2 | Method of integrated circuit scan clock domain allocation and machine readable media thereof | Physics | 0 | Active |
| US8479060B2 | Memory with self-test function and method for testing the same | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.