Stephen Knol
6Patents
2h-index
9Co-inventors
33Inventor score
Filing activity: Jul 18, 2014 → Apr 17, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9977078B2 | Systems and methods for wafer-level loopback test | Physics | 5 | Active |
| US9245870B1 | Systems and methods for providing data channels at a die-to-die interface | Electricity | 5 | Active |
| US10114074B2 | Systems and methods for wafer-level loopback test | Physics | 2 | Active |
| US9350339B2 | Systems and methods for clock distribution in a die-to-die interface | Electricity | 2 | Active |
| US10424921B2 | Die-to-die interface configuration and methods of use thereof | Electricity | 2 | Active |
| US9654090B2 | Systems and methods for clock distribution in a die-to-die interface | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.