Talat Hasan
10Patents
8h-index
5Co-inventors
61Inventor score
Filing activity: Apr 30, 1997 → Jul 28, 2006
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6690473B1 | Integrated surface metrology | Electricity | 49 | Expired |
| US5996415A | Apparatus and method for characterizing semiconductor wafers during processing | Physics | 47 | Expired |
| US6182510A | Apparatus and method for characterizing semiconductor wafers during processing | Physics | 30 | Expired |
| US6829054B2 | Integrated surface metrology | Electricity | 24 | Expired |
| US6112595A | Apparatus and method for characterizing semiconductor wafers during processing | Physics | 15 | Expired |
| US7089075B2 | Systems and methods for metrology recipe and model generation | Physics | 12 | Expired |
| US7283226B2 | Measurement system cluster | Physics | 11 | Active |
| US7254458B2 | Systems and methods for metrology recipe and model generation | Physics | 10 | Active |
| US6999164B2 | Measurement system cluster | Physics | 6 | Expired |
| US7106433B2 | Measurement system cluster | Physics | 5 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.