Inventor · Kyoto, JP

Tetsuo Hoki

13Patents
10h-index
13Co-inventors
65Inventor score

Filing activity: Oct 2, 1986 → Nov 28, 1995

Most-cited inventions

PatentTitleAreaCited byStatus
US4803734A Method of and apparatus for detecting pattern defects Physics 44 Expired
US5027417A Method of and apparatus for inspecting conductive pattern on printed board Physics 41 Expired
US5046113A Method of and apparatus for detecting pattern defects by means of a plurality of inspecting units each operating in accordance with a respective inspecting principle Physics 38 Expired
US5197105A Method of reading optical image of inspected surface and image reading system employabale therein Physics 31 Expired
US5774574A Pattern defect detection apparatus Physics 24 Expired
US5161202A Method of and device for inspecting pattern of printed circuit board Physics 17 Expired
US4797939A Pattern masking method and an apparatus therefor Physics 17 Expired
US5150423A Method of and device for inspecting pattern of printed circuit board Physics 14 Expired
US5408538A Method of and apparatus for inspecting the minimum annular width of a land on a printed circuit board Physics 12 Expired
US5144681A Method of and apparatus for inspecting conductive pattern on printed board Physics 10 Expired
US5150422A Method of and apparatus for inspecting conductive pattern on printed board Physics 8 Expired
US5347591A Method of and device for determining positioning between a hole and a wiring pattern on a printed circuit board by utilizing a set of area values Emerging Cross-Sectional Technologies 6 Expired
US5272762A Method of and apparatus for inspecting wiring pattern on printed board Physics 5 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.