Tetsuo Kumazawa
19Patents
10h-index
43Co-inventors
72Inventor score
Filing activity: Feb 27, 1979 → Apr 11, 2003
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5608265A | Encapsulated semiconductor device package having holes for electrically conductive material | Emerging Cross-Sectional Technologies | 422 | Expired |
| US5569960A | Electronic component, electronic component assembly and electronic component unit | Emerging Cross-Sectional Technologies | 57 | Expired |
| US5195155A | Optical coupling apparatus and manufacturing method of the same, and lens holder | Physics | 57 | Expired |
| US4446191A | Laminates comprising prepregs metal clad | Emerging Cross-Sectional Technologies | 35 | Expired |
| US4528223A | Composite fibrous product | Emerging Cross-Sectional Technologies | 30 | Expired |
| US5046798A | Semiconductor light emitting device and apparatus using the same | Electricity | 23 | Expired |
| US4880290A | Opto-electronic device and method for producing the device | Physics | 20 | Expired |
| US5637914A | Lead frame and semiconductor device encapsulated by resin | Electricity | 18 | Expired |
| US5671316A | Connecting structure of optical fiber to optical waveguide | Physics | 18 | Expired |
| US6049128A | Semiconductor device | Electricity | 15 | Expired |
| US6130112A | Semiconductor device | Electricity | 10 | Expired |
| US6455335B1 | Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step | Physics | 9 | Expired |
| US6566150B2 | Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step | Physics | 8 | Expired |
| US4335329A | Mask support for shadow mask assembly | Electricity | 6 | Expired |
| US6197603A | Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step | Physics | 4 | Expired |
| US5837567A | Lead frame and semiconductor device | Electricity | 4 | Expired |
| US4251746A | Direct-heated cathode structure | Electricity | 4 | Expired |
| US7198962B2 | Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step | Physics | 2 | Expired |
| US6297073A | Semiconductor device | Electricity | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.