Troy J. Perry
13Patents
6h-index
18Co-inventors
59Inventor score
Filing activity: Feb 15, 2006 → Jun 13, 2017
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7170299B1 | Electronic fuse blow mimic and methods for adjusting electronic fuse blow | Electricity | 16 | Expired |
| US7653888B2 | System for and method of integrating test structures into an integrated circuit | Physics | 12 | Active |
| US7382149B2 | System for acquiring device parameters | Physics | 7 | Active |
| US7791972B2 | Design structure for providing optimal field programming of electronic fuses | Physics | 7 | Active |
| US7518899B2 | Method of providing optimal field programming of electronic fuses | Physics | 7 | Active |
| US7512915B2 | Embedded test circuit for testing integrated circuits at the die level | Electricity | 6 | Active |
| US7884599B2 | HDL design structure for integrating test structures into an integrated circuit design | Physics | 5 | Active |
| US8570820B2 | Selectable repair pass masking | Physics | 2 | Active |
| US9653330B1 | Threshold voltage (VT)-type transistor sensitive and/or fan-out sensitive selective voltage binning | Electricity | 1 | Active |
| US9759767B2 | Pre-test power-optimized bin reassignment following selective voltage binning | Physics | 0 | Active |
| US9514999B2 | Systems and methods for semiconductor line scribe line centering | Electricity | 0 | Active |
| US8963566B2 | Thermally adaptive in-system allocation | Physics | 0 | Active |
| US10295592B2 | Pre-test power-optimized bin reassignment following selective voltage binning | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.