Tsunehiro Sakai
5Patents
3h-index
18Co-inventors
46Inventor score
Filing activity: Nov 19, 2009 → Jan 17, 2014
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8595666B2 | Semiconductor defect classifying method, semiconductor defect classifying apparatus, and semiconductor defect classifying program | Physics | 6 | Active |
| US8995748B2 | Defect image processing apparatus, defect image processing method, semiconductor defect classifying apparatus, and semiconductor defect classifying method | Electricity | 4 | Active |
| US8625906B2 | Image classification standard update method, program, and image classification device | Electricity | 3 | Active |
| US8472696B2 | Observation condition determination support device and observation condition determination support method | Physics | 2 | Active |
| US10141159B2 | Sample observation device having a selectable acceleration voltage | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.