Ute Kollmer
4Patents
1h-index
10Co-inventors
37Inventor score
Filing activity: Sep 25, 1998 → Dec 30, 2002
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6873173B2 | Test circuit arrangement and method for testing a multiplicity of transistors | Physics | 23 | Expired |
| US6831474B2 | Apparatus and method for testing a plurality of electrical components that are coupled to one another | Physics | 1 | Expired |
| US6870373B2 | Circuit configuration and method for assessing capacitances in matrices | Physics | 1 | Expired |
| US6097661A | Pointer circuit with low surface requirement high speed and low power loss | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.