Uwe Dersch
5Patents
2h-index
5Co-inventors
40Inventor score
Filing activity: Mar 5, 2007 → Jul 18, 2017
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9257353B1 | Integrated circuits with test structures including bi-directional protection diodes | Electricity | 5 | Active |
| US7354684B2 | Test pattern and method of evaluating the transfer properties of a test pattern | Physics | 3 | Active |
| US9786657B1 | Semiconductor structure including a transistor including a gate electrode region provided in a substrate and method for the formation thereof | Electricity | 2 | Active |
| US10048311B2 | Detection of gate-to-source/drain shorts | Physics | 1 | Active |
| US10147659B1 | Method and structure for process limiting yield testing | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.