Wang Jo Fei
3Patents
2h-index
7Co-inventors
27Inventor score
Filing activity: Mar 3, 2009 → Mar 31, 2009
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8229588B2 | Method and system for tuning advanced process control parameters | Physics | 25 | Active |
| US8392009B2 | Advanced process control with novel sampling policy | Electricity | 3 | Active |
| US8219341B2 | System and method for implementing wafer acceptance test (“WAT”) advanced process control (“APC”) with routing model | Electricity | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.