Wei Liu
21Patents
5h-index
67Co-inventors
68Inventor score
Filing activity: Mar 31, 2005 → Apr 12, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7302367B2 | Library accuracy enhancement and evaluation | Physics | 10 | Expired |
| US7783669B2 | Data flow management in generating profile models used in optical metrology | Physics | 9 | Active |
| US8600108B2 | Data processing system and method | Physics | 9 | Active |
| US7627392B2 | Automated process control using parameters determined with approximation and fine diffraction models | Physics | 9 | Active |
| US7617075B2 | Library accuracy enhancment and evaluation | Physics | 6 | Active |
| US7421414B2 | Split machine learning systems | Physics | 5 | Expired |
| US10573173B2 | Vehicle type identification method and device based on mobile phone data | Electricity | 2 | Active |
| US10949242B2 | Development of embedded type devices and running method for embedded type virtual device and system | Physics | 1 | Active |
| US7729873B2 | Determining profile parameters of a structure using approximation and fine diffraction models in optical metrology | Physics | 1 | Active |
| US10573174B2 | Method for judging highway abnormal event | Physics | 0 | Active |
| US10674315B2 | Method and device for judging intercity transportation mode based on mobile phone data | Electricity | 0 | Active |
| US12407407B2 | Method and device for constructing integrated space-terrestrial network | Electricity | 0 | Active |
| US7639375B2 | Determining transmittance of a photomask using optical metrology | Physics | 0 | Active |
| US7949490B2 | Determining profile parameters of a structure using approximation and fine diffraction models in optical metrology | Physics | 0 | Active |
| US10523655B2 | System and method for applications to share single sign on through lightweight directory access protocol (LDAP) integration | Electricity | 0 | Active |
| US7515283B2 | Parallel profile determination in optical metrology | Physics | 0 | Active |
| US7765234B2 | Data flow management in generating different signal formats used in optical metrology | Physics | 0 | Active |
| US12242535B2 | Method, system for providing sight information and computer-readable recording medium | Physics | 0 | Active |
| US7469192B2 | Parallel profile determination for an optical metrology system | Physics | 0 | Active |
| US11363008B2 | System and method for applications to share single sign on through lightweight directory access protocol (LDAP) integration | Electricity | 0 | Active |
| US8671134B2 | Method and system for data distribution in high performance computing cluster | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.