Wen Gu
15Patents
4h-index
20Co-inventors
52Inventor score
Filing activity: Jan 28, 2014 → Apr 25, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9544853B1 | Method and system for selectively activating a vehicle near field communication module | Emerging Cross-Sectional Technologies | 27 | Active |
| US9521238B1 | Establishing multiple short range wireless links between a vehicle and a mobile device | Electricity | 11 | Active |
| US9775112B2 | Enabling and disabling low energy, short-range wireless communication modules | Emerging Cross-Sectional Technologies | 4 | Active |
| US9913081B1 | Method and device for communicating with a vehicle system module while conserving power by using two different short range wireless communication (SRWC) protocols | Emerging Cross-Sectional Technologies | 4 | Active |
| US9955493B1 | Wireless access point detection and use by a vehicle | Electricity | 3 | Active |
| US9949303B2 | Short range wireless communication system for a vehicle | Emerging Cross-Sectional Technologies | 2 | Active |
| US10140838B2 | Automatic transmission of reminders for devices left behind | Physics | 2 | Active |
| US9816882B2 | Electronic skin, preparation method and use thereof | Performing Operations; Transporting | 1 | Active |
| US9612653B2 | Integrated circuit with selectable power-on reset mode | Emerging Cross-Sectional Technologies | 1 | Active |
| US9948762B2 | Communication integration via short range wireless connectivity relay | Electricity | 1 | Active |
| US9467392B2 | Communication identification between portable electronic devices and a motor vehicle | Electricity | 0 | Active |
| US11835492B2 | Method for preparing sample for wafer level failure analysis | Physics | 0 | Active |
| US9853693B2 | Locating an in-vehicle near field communication (NFC) antenna | Physics | 0 | Active |
| US11860073B2 | Wafer breaking method and chip failure analysis method | Electricity | 0 | Active |
| US10172076B2 | Unified in-vehicle Wi-Fi service | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.