Wooseok Ko
5Patents
2h-index
18Co-inventors
40Inventor score
Filing activity: Jul 26, 2010 → Jan 3, 2017
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9571625B2 | Electronic device and control method thereof | Electricity | 21 | Active |
| US9466537B2 | Method of inspecting semiconductor device and method of fabricating semiconductor device using the same | Electricity | 3 | Active |
| US10289371B2 | Electronic device and control method thereof | Electricity | 1 | Active |
| US9455121B2 | Semiconductor inspection system and methods of inspecting a semiconductor device using the same | Electricity | 0 | Active |
| US9583402B2 | Method of manufacturing a semiconductor device using semiconductor measurement system | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.