Yitzhak Vanek
4Patents
1h-index
3Co-inventors
33Inventor score
Filing activity: Jun 14, 2012 → Apr 27, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9752975B2 | Method and apparatus for determining cleanliness of a sample | Physics | 2 | Active |
| US12209940B2 | Apparatus and method to assess sub-micron particle levels of a sample | Physics | 0 | Active |
| US9746409B2 | Method and apparatus for determining cleanliness of a sample | Physics | 0 | Active |
| US9481922B2 | Process for forming porous metal coating on surfaces | Chemistry; Metallurgy | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.