Yoichiro Iwa
13Patents
3h-index
23Co-inventors
60Inventor score
Filing activity: Nov 2, 1998 → May 16, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6104481A | Surface inspection apparatus | Physics | 58 | Expired |
| US7524062B2 | Ophthalmologic apparatus | Human Necessities | 4 | Active |
| US7154597B2 | Method for inspecting surface and apparatus for inspecting it | Physics | 3 | Expired |
| US7533990B2 | Ophthalmologic apparatus | Human Necessities | 3 | Active |
| US6771364B2 | Surface inspecting apparatus | Physics | 3 | Expired |
| US7348585B2 | Surface inspection apparatus | Physics | 2 | Expired |
| US7245366B2 | Surface inspection method and surface inspection apparatus | Physics | 1 | Expired |
| US7417732B2 | Particle monitoring apparatus and vacuum processing apparatus | Physics | 1 | Active |
| US7477373B2 | Surface inspection method and surface inspection device | Physics | 1 | Active |
| US7227649B2 | Surface inspection apparatus | Physics | 0 | Expired |
| US7566129B2 | Ophthalmologic apparatus | Human Necessities | 0 | Active |
| US7394532B2 | Surface inspection method and apparatus | Physics | 0 | Expired |
| US10473579B2 | Apparatus for inspecting material property of plurality of measurement objects | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.