Yoon Huh
4Patents
4h-index
4Co-inventors
43Inventor score
Filing activity: Apr 8, 1996 → Nov 16, 2005
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6979869B2 | Substrate-biased I/O and power ESD protection circuits in deep-submicron twin-well process | Electricity | 36 | Expired |
| US5756389A | Method for forming trench isolation for semiconductor device | Electricity | 9 | Expired |
| US7453676B2 | RC-triggered ESD power clamp circuit and method for providing ESD protection | Electricity | 9 | Expired |
| US7119405B2 | Implantation method to improve ESD robustness of thick gate-oxide grounded-gate NMOSFET's in deep-submicron CMOS technologies | Electricity | 7 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.