Yoshimi Sudo
11Patents
8h-index
24Co-inventors
72Inventor score
Filing activity: May 25, 1983 → Dec 22, 2014
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5877498A | Method and apparatus for X-ray analyses | Electricity | 32 | Expired |
| US4504601A | Process for producing pre-foamed particles of polypropylene resin | Emerging Cross-Sectional Technologies | 23 | Expired |
| US4695593A | Prefoamed propylene polymer-base particles, expansion-molded article produced from said particles and production process of said article | Emerging Cross-Sectional Technologies | 21 | Expired |
| US4587270A | Preliminarily foamed particles of non-crosslinked polypropylene-type resin | Chemistry; Metallurgy | 21 | Expired |
| US4617323A | Prefoamed particles of crosslinked propylene-type resin and molded article prepared therefrom | Chemistry; Metallurgy | 19 | Expired |
| US4567208A | Preliminarily foamed particles of non-crosslinked polypropylene-type resin | Emerging Cross-Sectional Technologies | 18 | Expired |
| US4806293A | Method of producing a foamed, molded article | Performing Operations; Transporting | 14 | Expired |
| US5594246A | Method and apparatus for x-ray analyses | Electricity | 12 | Expired |
| US4504653A | Process for producing polyolefin resin particles | Chemistry; Metallurgy | 3 | Expired |
| US8946895B2 | Semiconductor device, manufacturing method of semiconductor device, semiconductor manufacturing and inspecting apparatus, and inspecting apparatus | Electricity | 0 | Active |
| US9362184B2 | Semiconductor device, manufacturing method of semiconductor device, semiconductor manufacturing and inspecting apparatus, and inspecting apparatus | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.