Patent · US Active

Apparatus and techniques to treat substrates using directional plasma and reactive gas

US10004133B2 · kind B2 · utility

4Cited by
0References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 7, 2017
Grant dateJun 19, 2018
Priority date
Expiry dateJul 7, 2037

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J2237/327
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

An apparatus to treat a substrate. The apparatus may include a reactive gas source having a reactive gas outlet disposed in a process chamber, the reactive gas outlet to direct a first reactive gas to the substrate; a plasma chamber coupled to the process chamber and including an extraction plate having an extraction aperture extending along a first direction, disposed within the process chamber and movable along a second direction perpendicular to the first direction between a first position facing the reactive gas source and a second position facing the extraction aperture; and a gas flow restrictor disposed between the reactive gas outlet and the extraction aperture, the gas flow restrictor defining a differential pumping channel between at least the plasma chamber and substrate stage.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.