Patent · US Active

Testing content addressable memory and random access memory

US10079070B2 · kind B2 · utility

1Cited by

5References

9Claims

0Family size

Assignee

International Business Machines Corporation · US

Inventors

Harry Barowski · Balingen, DE
Sheldon B. Levenstein · Austin, US
Pradip Patel · Poughkeepsie, US
Daniel Rodko · Poughkeepsie, US
Gordon B. Sapp · Austin, US
Rolf Sautter · Nagold, DE

Key dates

Filing date	Oct 20, 2016
Grant date	Sep 18, 2018
Priority date	—
Expiry date	Oct 20, 2036

Classification

Technology area (CPC G)Physics
CPC primaryG11C2029/3602
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

The present invention provides a system and method of testing CAMs and RAMs. In an exemplary embodiment, the system includes a multiple input signature register (MISR) logically coupled to digital outputs of a CAM, to digital inputs of a RAM, and to digital outputs of an ABIST controller circuit, where the MISR includes a plurality of L1 latch circuits logically coupled to a plurality of L2 latch circuits, a plurality of multiplexer circuits logically coupled to the plurality of L1 latch circuits, a plurality of exclusive or circuits (inner XOR circuits) logically coupled to the plurality of MUX circuits and to the plurality of L2 latch circuits, and at least two XOR circuits (outer XOR circuits), each of the outer XOR circuits logically coupled to one of the inner XOR circuits, to at least one of the MUX circuits, and to at least one of the L2 latch circuits.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.