Inventor · Poughkeepsie, NY, US

Daniel Rodko

19Patents
3h-index
21Co-inventors
56Inventor score

Filing activity: May 11, 2004 → Sep 17, 2021

Most-cited inventions

PatentTitleAreaCited byStatus
US7257745B2 Array self repair using built-in self test techniques Physics 12 Expired
US7305602B2 Merged MISR and output register without performance impact for circuits under test Physics 5 Expired
US7478297B2 Merged MISR and output register without performance impact for circuits under test Physics 5 Active
US9627012B1 Shift register with opposite shift data and shift clock directions Physics 3 Active
US8327207B2 Memory testing system Physics 2 Active
US10079070B2 Testing content addressable memory and random access memory Physics 1 Active
US9697910B1 Multi-match error detection in content addressable memory testing Physics 1 Active
US10170199B2 Testing content addressable memory and random access memory Physics 1 Active
US10971242B2 Sequential error capture during memory test Physics 1 Active
US10593420B2 Testing content addressable memory and random access memory Physics 1 Active
US10998075B2 Built-in self-test for bit-write enabled memory arrays Physics 1 Active
US10890623B1 Power saving scannable latch output driver Electricity 1 Active
US10288684B2 On-chip hardware-controlled window strobing Physics 0 Active
US7536613B2 BIST address generation architecture for multi-port memories Physics 0 Expired
US7275194B2 Clock duty cycle based access timer combined with standard stage clocked output register Physics 0 Expired
US11657887B2 Testing bit write operation to a memory array in integrated circuits Physics 0 Active
US10281527B2 On-chip hardware-controlled window strobing Physics 0 Active
US9983261B2 Partition-able storage of test results using inactive storage elements Physics 0 Active
US11462295B2 Microchip level shared array repair Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.