Inventor · Poughkeepsie, NY, US

Pradip Patel

23Patents
5h-index
27Co-inventors
69Inventor score

Filing activity: May 31, 1995 → Sep 11, 2019

Most-cited inventions

PatentTitleAreaCited byStatus
US5659551A Programmable computer system element with built-in self test method and apparatus for repair during power-on Physics 87 Expired
US5805789A Programmable computer system element with built-in self test method and apparatus for repair during power-on Physics 32 Expired
US5633877A Programmable built-in self test method and controller for arrays Physics 30 Expired
US7257745B2 Array self repair using built-in self test techniques Physics 12 Expired
US8055960B2 Self test apparatus for identifying partially defective memory Physics 9 Active
US7305602B2 Merged MISR and output register without performance impact for circuits under test Physics 5 Expired
US7478297B2 Merged MISR and output register without performance impact for circuits under test Physics 5 Active
US7529997B2 Method for self-correcting cache using line delete, data logging, and fuse repair correction Physics 4 Active
US9627012B1 Shift register with opposite shift data and shift clock directions Physics 3 Active
US7366953B2 Self test method and apparatus for identifying partially defective memory Physics 3 Expired
US8327207B2 Memory testing system Physics 2 Active
US6629280B1 Method and apparatus for delaying ABIST start Physics 2 Expired
US10890623B1 Power saving scannable latch output driver Electricity 1 Active
US10998075B2 Built-in self-test for bit-write enabled memory arrays Physics 1 Active
US9697910B1 Multi-match error detection in content addressable memory testing Physics 1 Active
US10079070B2 Testing content addressable memory and random access memory Physics 1 Active
US10593420B2 Testing content addressable memory and random access memory Physics 1 Active
US10971242B2 Sequential error capture during memory test Physics 1 Active
US10170199B2 Testing content addressable memory and random access memory Physics 1 Active
US7536613B2 BIST address generation architecture for multi-port memories Physics 0 Expired
US9983261B2 Partition-able storage of test results using inactive storage elements Physics 0 Active
US7275194B2 Clock duty cycle based access timer combined with standard stage clocked output register Physics 0 Expired
US8361776B2 Adaptation of Pitman Moore strain of rabies virus to primary chick embryo fibroblast cell cultures Chemistry; Metallurgy 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.