Methods of forming self-aligned vias
US10083834B2 · kind B2 · utility
60Cited by
3References
15Claims
0Family size
Assignee
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Key dates
| Filing date | Sep 28, 2017 |
| Grant date | Sep 25, 2018 |
| Priority date | — |
| Expiry date | Sep 28, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L21/76897
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
Processing methods comprising selectively orthogonally growing a first material through a mask to provide an expanded first material are described. The mask can be removed leaving the expanded first material extending orthogonally from the surface of the first material. Further processing can create a self-aligned via.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.