Patent · US Active

Methods of forming self-aligned vias

US10083834B2 · kind B2 · utility

60Cited by
3References
15Claims
0Family size

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Inventors

Key dates

Filing dateSep 28, 2017
Grant dateSep 25, 2018
Priority date
Expiry dateSep 28, 2037

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/76897
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Processing methods comprising selectively orthogonally growing a first material through a mask to provide an expanded first material are described. The mask can be removed leaving the expanded first material extending orthogonally from the surface of the first material. Further processing can create a self-aligned via.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.