Patent · US Active

Plasma processing apparatus

US10115567B2 · kind B2 · utility

36Cited by
1References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 14, 2015
Grant dateOct 30, 2018
Priority date
Expiry dateJun 23, 2037

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J2237/04
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A plasma processing apparatus can efficiently perform a pulse modulation method of switching a high frequency power to be used in a plasma process between a high level and a low level alternately according to a duty ratio of a modulation pulse. In this plasma processing apparatus, when performing a high/low pulse modulation on the high frequency power for plasma generation, if a weighted variable K is set to be 0.5<K<1, a constant reflection wave power PRH is generated on a high frequency transmission line of a plasma generation system even during a pulse-on period Ton. Meanwhile, during a pulse-off period Toff, a reflection wave power PRL decreases. By adjusting the value of K, a balance between the reflection wave power PRH during the pulse-on period Ton and the reflection wave power PRL during the pulse-off period Toff can be controlled.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.