Patent · US Active

Substrate processing systems, apparatus, and methods with factory interface environmental controls

US10192765B2 · kind B2 · utility

9Cited by
24References
23Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 11, 2014
Grant dateJan 29, 2019
Priority date
Expiry dateDec 23, 2035

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/67772
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Electronic device processing systems including environmental control of the factory interface are described. One electronic device processing system has a factory interface having a factory interface chamber, a load lock apparatus coupled to the factory interface, one or more substrate carriers coupled to the factory interface, and an environmental control system coupled to the factory interface and operational to monitor or control one of: relative humidity, temperature, an amount of oxygen, or an amount of inert gas within the factory interface chamber. In another aspect, purge of a carrier purge chamber within the factory interface chamber is provided. Methods for processing substrates are described, as are numerous other aspects.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.