Multiple waveguide structure with single flange for automatic test equipment for semiconductor testing
US10381707B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 4, 2016 |
| Grant date | Aug 13, 2019 |
| Priority date | — |
| Expiry date | Dec 15, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01P5/024
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
Embodiments of the present disclosure use customizable waveguides that can be positioned next to each other in a structure that contains one single flange to provide a physical connection for the waveguides. In this fashion, many waveguides can be positioned within a small area to accommodate a tightly packed patch antenna array so that the waveguides can be positioned very close to the socket. As such, embodiments of the present disclosure allow more waveguides to be packed into a small area by providing a single structure that houses many waveguides and share only a single flange connection element that can be sized appropriately.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.