Kosuke Miyao
5Patents
1h-index
7Co-inventors
33Inventor score
Filing activity: Jan 28, 2014 → Feb 4, 2016
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10114067B2 | Integrated waveguide structure and socket structure for millimeter waveband testing | Physics | 16 | Active |
| US10381707B2 | Multiple waveguide structure with single flange for automatic test equipment for semiconductor testing | Electricity | 1 | Active |
| US9647632B2 | Lumped element radio frequency tuning calibration process | Physics | 0 | Active |
| US10393772B2 | Wave interface assembly for automatic test equipment for semiconductor testing | Electricity | 0 | Active |
| US10944148B2 | Plating methods for modular and/or ganged waveguides for automatic test equipment for semiconductor testing | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.