Electrical testing apparatus for spintronics devices
US10509074B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 22, 2018 |
| Grant date | Dec 17, 2019 |
| Priority date | — |
| Expiry date | Feb 22, 2038 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/12
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A stimulus/response controller within a magnetic electrical test apparatus is configured for generating and transmitting stimulus waveforms to a high-speed DAC for application to a MTJ DUT. The response signal from the MTJ DUT is applied to an ADC that digitizes and transfers the response signal to the stimulus/response controller. The stimulus/response controller has a configurable function circuit that is selectively configured for performing evaluation and analysis of the digitized stimulus and response signals. The configurable functions are structured for performing any evaluation and analysis function for determining the characteristics of the MTJ DUT(s). Examples of the evaluation and analysis operations include averaging the stimulus and/or response signals, determining the differential resistance, the degradation times, failure counts, or the bit error rate of the MTJ DUT(s). The evaluations and analysis of the MTJ DUT are then available for transfer to a tester controller within the magnetic electrical test apparatus.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.