Patent · US Active

Method and apparatus for depositing cobalt in a feature

US10714388B2 · kind B2 · utility

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13Claims
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Assignee

Inventors

Key dates

Filing dateDec 17, 2018
Grant dateJul 14, 2020
Priority date
Expiry dateDec 17, 2038

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B43/27
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Methods and apparatus for depositing a cobalt layer in a feature, such as, a word line formed in a substrate, are provided herein. In some embodiments, method of processing a substrate includes: exposing a substrate at a first temperature to a cobalt containing precursor to deposit a cobalt layer within a word line feature formed in the substrate, wherein the word line feature is part of a 3D NAND device; and annealing the substrate to remove contaminants from the cobalt layer and to reflow the cobalt layer into the word line feature, wherein the substrate is at a second temperature greater than the first temperature during the annealing.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.