EPI thickness tuning by pulse or profile spot heating
US10770319B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 12, 2019 |
| Grant date | Sep 8, 2020 |
| Priority date | — |
| Expiry date | Feb 12, 2039 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L21/68792
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
Embodiments described herein provide processing chambers that include an enclosure for a processing volume, a rotatable support within the enclosure, the support having a shaft that extends outside the enclosure, wherein the shaft has a signal feature located outside the processing volume, an energy module within the enclosure, wherein the shaft extends through the energy module, one or more directed energy sources coupled to the enclosure, and one or more signalers positioned proximate to the signal feature, each signaler coupled to at least one of the directed energy sources.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.