Semiconductor device and method of forming the semiconductor device
US10784159B2 · kind B2 · utility
0Cited by
16References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 28, 2019 |
| Grant date | Sep 22, 2020 |
| Priority date | — |
| Expiry date | Feb 28, 2039 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L21/76895
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A semiconductor device includes a first dielectric layer including a first contact hole, a second dielectric layer formed on the first dielectric layer, and including a second contact hole aligned with the first contact hole, and a reflowed copper layer formed in the first and second contact holes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.