Patent · US Active

Stacked channel structures for MOSFETs

US10790281B2 · kind B2 · utility

7Cited by
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25Claims
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Key dates

Filing dateDec 3, 2015
Grant dateSep 29, 2020
Priority date
Expiry dateDec 3, 2035

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D84/0177

Abstract

Disclosed herein are stacked channel structures for metal oxide semiconductor field effect transistors (MOSFETs) and related circuit elements, computing devices, and methods. For example, a stacked channel structure may include: a semiconductor substrate having a substrate lattice constant; a fin extending away from the semiconductor substrate, the fin having an upper region and a lower region; a first transistor in the lower region, wherein the first transistor has a first channel, the first channel has a first lattice constant, and the first lattice constant is different from the substrate lattice constant; and a second transistor in the upper region, wherein the second transistor has a second channel, the second channel has a second lattice constant, and the second lattice constant is different from the substrate lattice constant.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.