Patent · US Active

NAND string pre-charge during programming by injecting holes via substrate

US10957394B1 · kind B1 · utility

4Cited by
10References
20Claims
0Family size

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Key dates

Filing dateFeb 10, 2020
Grant dateMar 23, 2021
Priority date
Expiry dateFeb 10, 2040

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C16/3459
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Apparatuses and techniques are described for pre-charging NAND string channels in a pre-charge phase of a program operation. In one aspect, a hole-type pre-charge process is used at the source end of a NAND string, where a bottom of the NAND string is connected to a p-well of a substrate. By applying a positive voltage to the p-well and a lower voltage, such as 0 V or a negative voltage, to the source-side select gate transistors and the memory cells, the holes from the p-well are injected into the channel In another approach, the hole-type pre-charge process and an electron-type pre-charge process are used sequentially in separate time periods. In another approach, the hole-type pre-charge process is used at the source end of a NAND string while the electron-type pre-charge process is used at the drain end of the NAND string.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.