Patent · US Active

Probe card assembly

US11085949B2 · kind B2 · utility

0Cited by

19References

20Claims

0Family size

Assignee

International Business Machines Corporation · US

Inventors

David M. Audette · Webster, US
Dustin M. Fregeau · South Burlington, US
David L. Gardell · Saint Albans, US
Peter W. Neff · Stowe, US
Frederick H. Roy, III · Williston, US
Grant Wagner · Jericho, US

Key dates

Filing date	Oct 18, 2019
Grant date	Aug 10, 2021
Priority date	—
Expiry date	Oct 18, 2039

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/2891
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A probe card assembly for nondestructive integrated circuit testing is disclosed. The probe card assembly includes an outer gimbal bearing with a tapered bearing surface being mounted on a top surface of a printed circuit board. The probe card assembly further includes an inner gimbal bearing with a spherical bearing surface which contacts the tapered bearing surface of the outer gimbal bearing at a single point of contact about a circumference thereof. The probe card assembly further includes a spring plate mounted to the outer gimbal bearing, providing a downward force to a substrate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.