Inventor · Jericho, VT, US

Grant Wagner

22Patents
2h-index
18Co-inventors
50Inventor score

Filing activity: Apr 30, 2010 → Dec 6, 2022

Most-cited inventions

PatentTitleAreaCited byStatus
US8471575B2 Methodologies and test configurations for testing thermal interface materials Physics 10 Active
US10261108B2 Low force wafer test probe with variable geometry Physics 3 Active
US9797928B2 Probe card assembly Physics 2 Active
US9116200B2 Methodologies and test configurations for testing thermal interface materials Physics 2 Active
US8836356B2 Vertical probe assembly with air channel Physics 1 Active
US11322473B2 Interconnect and tuning thereof Electricity 1 Active
US11675010B1 Compliant wafer probe assembly Physics 0 Active
US10663487B2 Low force wafer test probe with variable geometry Physics 0 Active
US12248003B2 Clustered rigid wafer test probe Physics 0 Active
US10444260B2 Low force wafer test probe Physics 0 Active
US11131689B2 Low-force wafer test probes Electricity 0 Active
US11085949B2 Probe card assembly Physics 0 Active
US10578648B2 Probe card assembly Physics 0 Active
US9081034B2 Rigid probe with compliant characteristics Physics 0 Active
US11662366B2 Wafer probe with elastomer support Physics 0 Active
US10955439B2 Electrochemical cleaning of test probes Electricity 0 Active
US10670653B2 Integrated circuit tester probe contact liner Physics 0 Active
US11041879B2 Fluidized alignment of a semiconductor die to a test probe Physics 0 Active
US11029334B2 Low force wafer test probe Physics 0 Active
US11561243B2 Compliant organic substrate assembly for rigid probes Electricity 0 Active
US9086433B2 Rigid probe with compliant characteristics Physics 0 Active
US11009545B2 Integrated circuit tester probe contact liner Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.