Peter W. Neff
9Patents
1h-index
8Co-inventors
36Inventor score
Filing activity: Sep 15, 2014 → Dec 6, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9797928B2 | Probe card assembly | Physics | 2 | Active |
| US10041976B2 | Gimbal assembly test system and method | Physics | 1 | Active |
| US10732202B2 | Repairable rigid test probe card assembly | Physics | 1 | Active |
| US11662366B2 | Wafer probe with elastomer support | Physics | 0 | Active |
| US10578648B2 | Probe card assembly | Physics | 0 | Active |
| US10514393B2 | Gimbal assembly test system and method | Physics | 0 | Active |
| US11675010B1 | Compliant wafer probe assembly | Physics | 0 | Active |
| US11085949B2 | Probe card assembly | Physics | 0 | Active |
| US12248003B2 | Clustered rigid wafer test probe | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.