Patent · US Active

Vertical transistor fabrication for memory applications

US11127760B2 · kind B2 · utility

0Cited by
3References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 1, 2019
Grant dateSep 21, 2021
Priority date
Expiry dateFeb 1, 2039

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/67742
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Embodiments of the present disclosure provide an apparatus and methods for forming stair-like structures with accurate profiles and dimension control for manufacturing three dimensional (3D) stacked memory cell semiconductor devices. In one embodiment, a memory cell device includes a film stack comprising alternating pairs of dielectric layers and conductive structures horizontally formed on a substrate, an opening formed in the film stack, wherein the opening is filled with a channel layer and a center filling layer, and a protective liner layer disposed between the conductive structure and the channel layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.