Patent · US Active

Shadow ring for modifying wafer edge and bevel deposition

US11136665B2 · kind B2 · utility

0Cited by
40References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 28, 2019
Grant dateOct 5, 2021
Priority date
Expiry dateApr 5, 2040

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/68735
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

Embodiments of the invention contemplate a shadow ring that provides increased or decreased and more uniform deposition on the edge of a wafer. By removing material from the top and/or bottom surfaces of the shadow ring, increased edge deposition and bevel coverage can be realized. In one embodiment, the material on the bottom surface is reduced by providing a recessed slot on the bottom surface. By increasing the amount of material of the shadow ring, the edge deposition and bevel coverage is reduced. Another approach to adjusting the deposition at the edge of the wafer includes increasing or decreasing the inner diameter of the shadow ring. The material forming the shadow ring may also be varied to change the amount of deposition at the edge of the wafer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.