Semiconductor device and method for forming a semiconductor device
US11217500B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 9, 2019 |
| Grant date | Jan 4, 2022 |
| Priority date | — |
| Expiry date | Apr 9, 2039 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D62/106
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A semiconductor device includes a contact metallization layer arranged on a semiconductor substrate, an inorganic passivation structure arranged on the semiconductor substrate, and an organic passivation layer. The organic passivation layer is located between the contact metallization layer and the inorganic passivation structure, and located vertically closer to the semiconductor substrate than a part of the organic passivation layer located on top of the inorganic passivation structure.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.