Stefan Kramp
14Patents
2h-index
27Co-inventors
50Inventor score
Filing activity: Jul 25, 2008 → Aug 31, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8441804B2 | Semiconductor device and method of manufacturing a semiconductor device | Electricity | 2 | Active |
| US10236265B2 | Semiconductor chip and method for forming a chip pad | Electricity | 2 | Active |
| US9786620B2 | Semiconductor device and a method for manufacturing a semiconductor device | Electricity | 2 | Active |
| US9905685B2 | Semiconductor device and trench field plate field effect transistor with a field dielectric including thermally grown and deposited portions | Electricity | 1 | Active |
| US9435849B2 | Method for testing semiconductor dies and a test apparatus | Physics | 0 | Active |
| US10418319B2 | Method of manufacturing a semiconductor device | Electricity | 0 | Active |
| US11926769B2 | Storage-stable, reactive, pressure-sensitive adhesive tape | Chemistry; Metallurgy | 0 | Active |
| US11043383B2 | Electrical contact connection on silicon carbide substrate | Electricity | 0 | Active |
| US12327727B2 | Chip with a silicon carbide substrate | Electricity | 0 | Active |
| US11798807B2 | Process for producing an electrical contact on a silicon carbide substrate | Electricity | 0 | Active |
| US10636754B2 | Semiconductor chip and method for forming a chip pad | Electricity | 0 | Active |
| US11217500B2 | Semiconductor device and method for forming a semiconductor device | Electricity | 0 | Active |
| US11842938B2 | Semiconductor device and method for forming a semiconductor device | Electricity | 0 | Active |
| US10018667B2 | Method for testing semiconductor dies | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.