Voltage offset bin selection by die group for memory devices
US11270772B1 · kind B1 · utility
3Cited by
2References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 31, 2020 |
| Grant date | Mar 8, 2022 |
| Priority date | — |
| Expiry date | Aug 31, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2211/5644
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
One or more blocks at the memory device are programed. The one or more blocks are associated with a block family and with one or more dice of a die group. A voltage offset bin associated with the die group and the block family is determined based on a subset of dice of the die group. Metadata associated with the memory device is appended to include a record associating the die group and the block family with the voltage offset bin.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.