Shane Nowell
89Patents
7h-index
44Co-inventors
72Inventor score
Filing activity: Nov 6, 1996 → Mar 25, 2024
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5841605A | Caddy for cartridge and disk drive accomodating a caddy | Physics | 16 | Expired |
| US5930090A | Data cartridge with compression return spring following arcuate guide | Physics | 15 | Expired |
| USD408808S | Miniature memory cartridge | General | 13 | Expired |
| USD405438S | Computer disk cartridge | General | 10 | Expired |
| US6005755A | Shutter shell encapsulating disk medium | Physics | 10 | Expired |
| US10553290B1 | Read disturb scan consolidation | Physics | 9 | Active |
| US11263134B1 | Block family combination and voltage bin selection | Emerging Cross-Sectional Technologies | 8 | Active |
| US11340813B1 | Reliability scan assisted voltage bin selection | Physics | 6 | Active |
| USD426241S | Removable computer disk cartridge | General | 6 | Expired |
| US11132037B2 | Operating temperature management of a memory sub-system | Emerging Cross-Sectional Technologies | 5 | Active |
| USD413115S | Miniature disk cartridge | General | 5 | Expired |
| US10732890B2 | Adjusting a parameter for a programming operation based on the temperature of a memory system | Physics | 5 | Active |
| US9600205B1 | Power aware power safe write buffer | Emerging Cross-Sectional Technologies | 5 | Active |
| USD488817S1 | Cartridge for a data storage disk | General | 4 | Expired |
| US6147837A | Data cartridge having arcuate shutter spring | Physics | 4 | Expired |
| US11410734B1 | Voltage bin selection for blocks of a memory device after power up of the memory device | Physics | 4 | Active |
| US11270772B1 | Voltage offset bin selection by die group for memory devices | Physics | 3 | Active |
| US5969916A | Disk cartridge with shutter opening arm alignment surface and retraction slot | Physics | 3 | Expired |
| US11372545B2 | Managing bin placement for block families of a memory device based on trigger metric values | Physics | 3 | Active |
| US11404139B2 | Smart sampling for block family scan | Physics | 3 | Active |
| US11443830B1 | Error avoidance based on voltage distribution parameters of block families | Physics | 2 | Active |
| US11593005B2 | Managing voltage bin selection for blocks of a memory device | Physics | 2 | Active |
| USD402975S | Combined top and bottom cartridge shells | General | 2 | Expired |
| US11709727B2 | Managing error-handling flows in memory devices | Physics | 2 | Active |
| US11676664B2 | Voltage bin selection for blocks of a memory device after power up of the memory device | Physics | 2 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.