Read threshold optimization systems and methods using model-less regression
US11335417B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 28, 2020 |
| Grant date | May 17, 2022 |
| Priority date | — |
| Expiry date | Nov 20, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C16/0483
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A controller optimizes a read threshold value for a memory device using model-less regression. The controller performs read operations on cells using read threshold voltage values. The controller measures probability values for the multiple read threshold voltage values, and estimates a threshold voltage distribution curve based on the multiple read threshold voltage values and the measured probability values using a set regression formula. The controller determines a read threshold voltage value corresponding to a set point on the threshold voltage distribution curve, and performs a read operation on the cells using the read threshold voltage value.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.