Voltage bin selection for blocks of a memory device after power up of the memory device
US11410734B1 · kind B1 · utility
4Cited by
3References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 31, 2021 |
| Grant date | Aug 9, 2022 |
| Priority date | — |
| Expiry date | Mar 31, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2211/5641
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A processing device of a memory sub-system is configured to detect a power on event associated with the memory device; scan one or more blocks of a plurality of blocks of the memory device to determine a corresponding time after program (TAP) associated with each block of the one or more blocks; estimate, based on the corresponding TAP of the each block of the one or more blocks, a duration of a power off state preceding the power on event; and update voltage bin assignments of the plurality of blocks associated with the memory device based on the duration of the power off state.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.