Optimized seasoning trim values based on form factors in memory sub-system manufacturing
US11495316B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 2, 2021 |
| Grant date | Nov 8, 2022 |
| Priority date | — |
| Expiry date | Sep 2, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/4402
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system and method for optimizing seasoning trim values based on form factors in memory sub-system manufacturing. An example method includes selecting a baseline set of trim values based on a set of memory sub-system form factors; generating a first modified set of trim values by modifying a first trim value of the baseline trim values; instructing each memory sub-system to perform seasoning operations using the first modified set of trim values; responsive to determining that each memory sub-system passed failure scanning operations, generating a second modified set of trim values; instructing each memory sub-system to perform seasoning operations using the second modified set; responsive to determining that a memory sub-system failed the failure scanning operations, determining whether the failed memory sub-system is defective; and responsive to determining that the failed memory sub-system does is not defective, storing the first modified trim values for the set of form factors.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.