Sub-wavelength structural material having patch type array and compatibility of low detectability for infrared, laser, and microwave

US11592602B2 · kind B2 · utility

Assignee

• Institute of Optics and Electronics, Chinese Academy of Sciences · CN

Inventors

• Xiangang Luo · Fremont, US
• Mingbo Pu · Chengdu, CN
• Xiong Li · Allen, US
• Xiaoliang Ma · Port Matilda, US
• Guoqing Paul Shen · Blacksburg, US

Key dates

• Filing date: Jul 17, 2018
• Grant date: Feb 28, 2023
• Expiry date: Dec 13, 2039

Classification

• Technology area (CPC H): Electricity
• CPC primary: H01Q15/142
• WIPO field: Optics
• WIPO sector: Instruments

Abstract

The present disclosure provides a sub-wavelength structural material having compatibility of low detectability for infrared, laser, and microwave, which includes, from top to bottom, a metal type frequency selective surface layer I, a dielectric layer I, a metal type frequency selective surface layer II, a dielectric layer II, a resistive film, a dielectric layer III. Each of the metal type frequency selective surface layers is a sub-wavelength patch type array, and metal used by the metal type frequency selective surface layers has a characteristic of low infrared emissivity. The present disclosure modulates a phase by using a phase difference generated by patches with different sizes on the metal type frequency selective surface layer I, so as to control backscattering of incident electromagnetic waves to achieve compatibility of low detectability for laser and infrared, while the bottom three layers achieve absorption of microwave.