Patent · US Active

Glitch source identification and ranking

US11651131B2 · kind B2 · utility

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20Claims
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Key dates

Filing dateJun 1, 2021
Grant dateMay 16, 2023
Priority date
Expiry dateAug 6, 2041

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F2119/12
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Glitch source identification and ranking is provided by: identifying a plurality of glitch sources in a circuit layout; back referencing the plurality of glitch sources to corresponding lines in a Resistor Transistor Logic (RTL) file defining the plurality of glitch sources; identifying, in the circuit layout, a plurality of glitch terminuses associated with the plurality of glitch sources; determining a plurality of glitch power consumption values associated with the plurality of glitch sources based on fanouts in the circuit layout extending from the plurality of glitch sources to the plurality of glitch terminuses; ranking, by a processor, the plurality of glitch sources based on corresponding glitch power consumption values of the plurality of glitch power consumption values corresponding to individual glitch sources of the plurality of glitch sources; and reporting the corresponding lines in the RTL file associated with the ranked plurality of glitch sources.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.