Qing Su
19Patents
5h-index
17Co-inventors
59Inventor score
Filing activity: Nov 1, 2004 → Aug 25, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8264065B2 | ESD/antenna diodes for through-silicon vias | Electricity | 231 | Active |
| US7346865B2 | Fast evaluation of average critical area for IC layouts | Physics | 14 | Expired |
| US7707526B2 | Predicting IC manufacturing yield based on hotspots | Physics | 10 | Active |
| US8762918B2 | Banded computation architectures | Physics | 7 | Active |
| US8151236B2 | Steiner tree based approach for polygon fracturing | Physics | 6 | Active |
| US7289933B2 | Simulating topography of a conductive material in a semiconductor wafer | Physics | 5 | Expired |
| US7679872B2 | Electrostatic-discharge protection using a micro-electromechanical-system switch | Electricity | 4 | Active |
| US7543255B2 | Method and apparatus to reduce random yield loss | Emerging Cross-Sectional Technologies | 4 | Active |
| US8458635B2 | Convolution computation for many-core processor architectures | Physics | 4 | Active |
| US8000826B2 | Predicting IC manufacturing yield by considering both systematic and random intra-die process variations | Emerging Cross-Sectional Technologies | 3 | Active |
| US7962873B2 | Fast evaluation of average critical area for ic layouts | Physics | 2 | Active |
| US8999766B2 | ESD/antenna diodes for through-silicon vias | Electricity | 1 | Active |
| US11531797B1 | Vector generation for maximum instantaneous peak power | Physics | 1 | Active |
| US8205179B2 | Fast evaluation of average critical area for IC layouts | Physics | 1 | Active |
| US8205185B2 | Fast evaluation of average critical area for IC layouts | Physics | 1 | Active |
| US7962882B2 | Fast evaluation of average critical area for IC layouts | Physics | 1 | Active |
| US8877638B2 | ESD/antenna diodes for through-silicon vias | Electricity | 0 | Active |
| US11651131B2 | Glitch source identification and ranking | Physics | 0 | Active |
| US12001768B1 | Enhanced glitch estimation in vectorless power analysis | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.