Patent · US Active

Silicon nitride etching composition and method

US11697767B2 · kind B2 · utility

0Cited by
5References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 7, 2021
Grant dateJul 11, 2023
Priority date
Expiry dateJun 7, 2041

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/32134
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Compositions useful for the selective removal of silicon nitride materials relative to polysilicon, silicon oxide materials and/or silicide materials from a microelectronic device having same thereon are provided. The compositions of the invention are particularly useful in the etching of 3D NAND structures.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.